論文一覧

太字は東芝アナリシス株式会社所属

2024年

著者・題目・雑誌など
T. Ogura, Y. Aruga, T. Kochi, N. Mayama Age hardening behavior and mechanical properties of Al-11%Zn-3%Mg-1.4%Cu (-0.2%Ag) alloys Materials Transactions, doi:10.2320/matertrans.MT-L2024013
玉作賢治, 田口宗孝, 井上伊知郎, 大阪泰斗, 犬伏雄一, 矢橋牧名, 石川哲也 非線形な共鳴非弾性X線散乱による二次元蛍光X線分光 光学, 2024, 53巻, 6号, p.233
城後香里, 間山憲仁 アトムプローブと走査型透過電子顕微鏡による複合分析実例紹介と最近の話題 異物の分析技術と試料の前処理、結果の解釈, 出版社：株式会社エヌ・ティー・エス, 2024, 第1章, 第11節
T. Amemiya, K. Suzuki, T. Tomita Non-destructive visualization of internal structural changes in humidified magnesium oxide tablets using X-ray computed tomography Scientific Reports, doi:10.1038/s41598-024-56949-8

2023年

著者・題目・雑誌など
小椋 智, 有賀 康博, 高知 琢哉, 間山 憲仁 Al-11%Zn-3%Mg-1.4%Cu (-0.2%Ag) 合金の時効硬化挙動と機械的特性 軽金属, doi:10.2464/jilm.73.604
M. C. Hsieh, M. Nishijima, K. Jogo, Z. Zhang, R. Okumuara, H. Yoshida, C. Chen, A. Suetake, H. Honma, H. Seto, Y. Kitahara, K. Kita, K. Suganuma Structural investigation of nanovoids around the interface of micro-vias by spherical aberration corrected scanning transmission electron microscopy Microelectronics Reliability, doi:10.1016/j.microrel.2023.115231
Y. Sasaki, H. Uematsu, S. Takazawa, M. Abe, N. Ishiguro, J. Koyama, N. Mayama, Y. Terui, Y. Takahashi Nondestructive observation of nanopipe in GaN crystal by x-ray ptychographic coherent diffraction imaging Proceedings of the 15th International Conference on X-ray Microscopy-XRM2022, doi:10.1063/5.0168127
K. Tamasaku, M. Taguchi, I. Inoue, T. Osaka, Y. Inubushi, M. Yabashi, T. Ishikawa Two-dimensional Kβ-Kα fluorescence spectrum by nonlinear resonant inelastic X-ray scattering Nature Communications, doi:10.1038/s41467-023-39967-4
間山 憲仁, 城後 香里 アトムプローブと走査型透過電子顕微鏡による複合分析実例紹介と最近の話題 クリーンテクノロジー, 2023, 33巻, 6号, p.14-18
R. Horie, T. Matsushita, S. Kawamura, T. Hase, K. Horigane, H. Momono, S. Takeuchi, M. Tanaka, H. Tomita, Y. Hashimoto, K. Kobayashi, Y. Haruyama, H. Daimon, Y. Morikawa, M. Taguchi, J. Akimitsu Origin of unexpected Ir3+ in a superconducting candidate Sr2IrO4 system analyzed by photoelectron holography Inorganic Chemistry, doi:10.1021/acs.inorgchem.2c03788

2022年

著者・題目・雑誌など
K. Murakawa, N. Mayama, T. Mizuno Influence of High Temperature N2 Annealing on Photoluminescence of SiC and Si Quantum Dots in SiO2 Layer 2022 International Symposium on Semiconductor Manufacturing (ISSM), doi:10.1109/ISSM55802.2022.10026911
K. Suzuki, M. Yoshiki, N. Nishikawa, T. Harada, Y. Fujita, Y. Terui, T. Yoshida, T. Tomita Visualizing fluid transport inside orally disintegrating tablets and changes in tablets using real-time X-ray radiography and X-ray computed tomography Drug Development and Industrial Pharmacy, doi:10.1080/03639045.2022.2108831

2021年

著者・題目・雑誌など
間山 憲仁, 城後 香里, 渡辺 圭, 石村 聡 アトムプローブと走査型透過電子顕微鏡複合分析の実用例紹介と最近の話題 表面と真空, doi:10.1380/vss.64.515
N. Sone, D. Jinno, Y. Miyamoto, R. Okuda, S. Yamamura, Y. Jinno, W. Lu, D.-P. Han, K. Okuno, K. Mizutani, S. Nakajima, J. Koyama, S. Ishimura, N. Mayama, M. Iwaya, T. Takeuchi, S. Kamiyama, I. Akasaki Analysis of impurity doping in tunnel junction grown on core-shell structure composed of GaInN/GaN multiple-quantum-shells and GaN nanowire Japanese Journal of Applied Physics, doi:10.35848/1347-4065/ac3728
M. Okayasu, N. Sahara, N. Mayama Effect of the microstructural characteristics of die-cast ADC12 alloy controlled by Na and Cu on the mechanical properties of the alloy Materials Science and Engineering: A, doi.org/10.1016/j.msea.2021.142120
Y. Yamamoto, H. Yamaoka, T. Kawai, M. Yoshida, J. Yamaura, K. Ishii, S. Onari, T. Uozumi, A. Hariki, M. Taguchi, K. Kobayashi, J.-F. Lin, N. Hiraoka, H. Ishii, K.-D. Tsuei, H. Okanishi, S. Iimura, S. Matsuishi, H. Hosono, J. Mizuki Electronic and crystal structures of LnFeAsO1-xHx (Ln = La, Sm) studied by x-ray absorption spectroscopy, x-ray emission spectroscopy, and x-ray diffraction: Ⅱ pressure dependence Journal of Physics: Condensed Matter, doi:10.1088/1361-648X/abfaf4
Y. Yamamoto, H. Yamaoka, T. Uozumi, A. Hariki, S. Onari, J. Yamaura, K. Ishii, T. Kawai, M. Yoshida, M. Taguchi, K. Kobayashi, J.-F. Lin, N. Hiraoka, H. Ishii, K.-D. Tsuei, H. Okanishi, S. Iimura, S. Matsuishi, H. Hosono, J. Mizuki Electronic and crystal structures of LnFeAsO1-xHx (Ln = La, Sm) studied by x-ray absorption spectroscopy, x-ray emission spectroscopy, and x-ray diffraction: part Ⅰ carrier-doping dependence Journal of Physics: Condensed Matter, doi:10.1088/1361-648X/abf9b9
T. Mizutani, S. Tanaka, T. Saze, K. Fujii, H. Matsuoka, M. Nakano, H. Wadati, M. Kitamura, K. Horiba, Y. Iwasa, H. Kumigashira, M. Yoshiki, M. Taguchi Total reflection hard X-ray photoelectron spectroscopy: Application to strongly correlated electron systems PHYSICAL REVIEW B, doi:10.1103/PhysRevB.103.205113

2020年

著者・題目・雑誌など
H. Yamaoka, E. F. Schwier, Y. Yamamoto, M. Nakatake, M. Sawada, H. Sakurai, N. Tsujii, M. Arita, H. Iwasawa, M. Taguchi, K. Shimada, J. Mizuki Electronic and crystal structures of (Na1-xCax)Cr2O4 with anomalous colossal magnetoresistance PHYSICAL REVIEW B, doi:10.1103/PhysRevB.102.235150
T. Nakano, Y. Harashima, K. Chokawa, K. Shiraishi, A. Oshiyama, Y. Kangawa, S. Usami, N. Mayama, K. Toda, A. Tanaka, Y. Honda, H. Amano Screw dislocation that converts p-type GaN to n-type: Microscopic study on Mg condensation and leakage current in p-n diodes Applied Physics Letters, doi:10.1063/5.0010664

2019年

著者・題目・雑誌など
T. Kinoshita, T. Muro, T. Matsushita, H. Osawa, T. Ohkochi, F. Matsui, H. Matsuda, M. Shimomura, M. Taguchi, H. Daimon Progress in photoelectron holography at SPring-8 Japanese Journal of Applied Physics, doi:10.7567/1347-4065/ab4d28
T. Pincelli, R. Cucini, A. Verna, F. Borgatti, M. Oura, K. Tamasaku, H. Osawa, T.-L. Lee, C. Schlueter, S. Gunther, C. H. Back, M. Dell'Angela, R. Ciprian, P. Orgiani, A. Petrov, F. Sirotti, V. A. Dediu, I. Bergenti, P. Graziosi, F. Miletto Granozio, Y. Tanaka, M. Taguchi, H. Daimon, J. Fujii, G. Rossi, G. Panaccione Transient quantum isolation and critical behavior in the magnetization dynamics of half-metallic manganites PHYSICAL REVIEW B, doi:10.1103/PhysRevB.100.045118
S. Usami, N. Mayama, K. Toda, A. Tanaka, M. Deki, S. Nitta, Y. Honda, H. Amano Direct evidence of Mg diffusion through threading mixed dislocations in GaN p-n diodes and its effect on reverse leakage current Applied Physics Letters, doi:10.1063/1.5097767
M. Taguchi, F. Matsui, N. Maejima, H. Matsui, H. Daimon Disorder and mixed valence properties of Sr2FeMoO6 studied by photoelectron diffraction and x-ray absorption spectroscopy Surface Science, doi:10.1016/j.susc.2019.02.001
H. Oomae, M. Shinoda, J.T. Asubar, K. Sato, H. Toyota, N. Mayama, B. Mehdiyev, N. Uchitomi Spatial distribution of substitutional Mn-As clusters in ferromagnetic (Zn,Sn,Mn)As2 thin films revealed by image Journal of Applied Physics, doi:10.1063/1.5070074

2018年以前

著者・題目・雑誌など
T. Mizuno, Y. Omata, R. Kanazawa, Y. Iguchi, S. Nakada, T. Aoki, T. Sasaki Nano-SiC region formation in (100) Si-on-insulator substrate: Optimization of hot-C+-ion implantation process to improve photoluminescence intensity Japanese Journal of Applied Physics, doi:10.7567/JJAP.57.04FB03
T. Kinno, T. Sasaki, M. Tomita, T. Ohkubo Quantitativeness in laser-assisted atom probe analysis of boron and carbon codoped in silicon Japanese Journal of Applied Physics, doi:10.7567/JJAP.56.116601
小熊 規泰、坂本 龍、 佐々木 智一、新井 納生美 超高サイクル疲労で形成されたFGAの3D-AP評価 3D-AP Evaluation of FGA Formed in Very High Cycle Fatigue 一般社団法人 日本機械学会, doi:10.1299/jsmesed.2017.16.120
H. Tsuji, M. Kato, N. Mayama, T. Sasaki, E. Nomura, Y. Gotoh Evaluation of Ge Oxidation State in Ge Nanoparticles Formed in Thin SiO2 Layer by Negative-Ion Implantation and Successive Two-Stage Annealing Transactions of the Materials Research Society of Japan, doi:10.14723/tmrsj.41.305
T. Yukawa, M. Morita, M. Karasawa, S. Ishimura, N. Mayama, H. Uchida, Y. Kawamura, K.M. Itoh, M. Owari Reconstruction in Atom Probe Tomography Considering the Cone Angle of Needle-Like Shaped Samples and Evaluation of Reliability e-Journal of Surface Science and Nanotechnology, doi:10.1380/ejssnt.2015.235
M. Karasawa, M. Fujii, M. Morita, S. Ishimura, N. Mayama, H. Uchida,Y. Kawamura, K.M. Itoh, M. Owari Investigation of mixing effects of silicon isotopes under shave-off condition using atom probe tomography Surface and Interface Analysis, doi:10.1002/sia.5645
K. Inoue, H. Takamizawa, Y. Shimizu, F. Yano, T. Toyama, A. Nishida, T. Mogami, K. Kitamoto, T. Miyagi, J. Kato, S. Akahori, N. Okada, M. Kato,Y. Nagai Three-Dimensional Dopant Characterization of Actual Metal-Oxide-Semiconductor Devices of 65 nm Node by Atom Probe Tomography Applied physics express, doi:10.7567/APEX.6.046502
T. Sonehara, A. Hokazono, H. Akutsu, T. Sasaki, H. Uchida, M. Tomita, S. Kawanaka, S. Inaba, Y. Toyoshima Mechanism of Contact Resistance Reduction in Nickel Silicide Films by Pt Incorporation IEEE Transactions on Electron Devices, doi:10.1109/TED.2011.2166557
Y. Shimizu, Y. Kawamura, M. Uematsu, M. Tomita, T. Kinno, N. Okada, M. Kato, H. Uchida, M. Takahashi, H. Ito, H. Ishikawa, Y. Ohji, H. Takamizawa, Y. Nagai, K. M. Itoh Depth and lateral resolution of laser-assisted atom probe microscopy of silicon revealed by isotopic heterostructures Journal of Applied Physics, doi:10.1063/1.3544496
Y. Shimizu, H. Takamizawa, K. Inoue, T. Toyama, Y. Nagai, N. Okada, M. Kato, H. Uchida, F. Yano, T. Tsunomura, A. Nishida , T. Mogami Impact of carbon coimplantation on boron behavior in silicon: Carbon-boron coclustering and suppression of boron Applied Physics Letters, doi:10.1063/1.3597303
Y. Shimizu, Y. Kawamura, M. Uematsu, K.M. Itoh, M. Tomita, M. Sasaki, H. Uchida, M. Takahashi Atom probe microscopy of three-dimensional distribution of silicon isotopes in 28Si/30Si isotope superlattices with sub-nanometer spatial resolution Journal of Applied Physics, doi:10.1063/1.3236673

[ 更新日:2024/10/04 ]