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TOSHIBA NANOANALYSIS CORPORATION

Services

Organic Component Analysis

TNA offers high-sensitivity microscopic trace analysis services for various organic components and high polymers.

Our service offerings

  • Structural analysis of organic components
  • Qualitative and quantitative analysis of microscopic trace organic components
  • Thermophysical properties evaluation of organic materials
  • Generated gas and thermal desorption analysis

Examples

  • Analysis of floating microparticles in a liquid-crystal display (LCD) panel (Raman, FT-IR, TOF-SIMS)
  • Analysis of organic microparticles in an inkjet nozzle (Raman, FT-IR)
  • Analysis of organic substances adhering to electronic component terminals (Raman, FT-IR)
  • Analysis of organic foreign matter collected on filter
  • Analysis of positive and negative terminal materials in a rechargeable battery (Raman)
  • Analysis of electrolyte degradation of a rechargeable battery (LC/MS, NMR, GC/MS)
  • Qualitative analysis of a rechargeable battery separator (DSC, FT-IR)
  • Diffusion coefficient measurement of an electrolyte using the PFG-NMR method
  • Solid-state 7Li-NMR analysis of lithium insertion into hard carbon materials
  • Analysis of binder resin in a rechargeable lithium-ion battery
  • Trace analysis of the deteriorated electrolyte in rechargeable lithium-ion batteries
  • Analysis of generated gas in a rechargeable lithium-ion battery
  • Investigation of causes of flat-panel display faults (GC-/MS, LC/MS, TOF-SIMS, IC)
  • Analysis of gas forms in a LCD panel using the TPD/MS method
  • Analysis of gas desorption from an organic thin film using the TPD/MS method
  • Analysis of gas desorption from a tablet under high-temperature conditions
  • Structure determination of impurities in a fullerene derivative
  • Analysis of antioxidants in plastics using LC/MS
  • Structural analysis of an oriented film (NMR, FT-IR, LC/MS, GC/MS)
  • Depth profiles of the additives in a semiconductor photoresist polymer using a high-precision low-angle cutting technique
  • Analysis of the LCD multilayer structure using a high-precision low-angle cutting technique
  • Analysis of volatile components from packing materials using GC/MS
  • Analysis of rinsing residuals on various boards (TOF-SIMS)
  • Degree of cure of adhesives

Major equipment

  • Liquid chromatograph-mass spectrometer (LC/MS)
  • Gas chromatograph-mass spectrometer (GC/MS)
  • Time-of-flight secondary ion mass spectrometer (TOF-SIMS)
  • Temperature-programmed desorption mass spectrometer (TPD/MS)
  • Fourier transform infrared spectroscope (FT-IR)
  • Fourier transform infrared microspectroscopic imaging system (μFT-IR)
  • Raman spectroscopic analyzer
  • Ion chromatography system (IC)
  • High-performance liquid chromatography system (HPLC)
  • Karl Fisher water content measurement system
  • Total organic carbon analyzer (TOC)
  • Thermal analysis equipment (TG-DTA, DSC, TMA)
  • Nuclear magnetic resonance system (NMR)
  • Glove box

Liquid chromatograph/quadrupole time-of-flight mass spectrometer (LC/TOF-MS)
Liquid chromatograph/quadrupole time-of-flight mass spectrometer (LC/TOF-MS)

Infrared microspectroscopic imaging of floating microparticles
Infrared microspectroscopic imaging of floating microparticles

Raman spectroscopic analyzer
Raman spectroscopic analyzer

Time-of-flight secondary ion mass spectrometer (TOF-SIMS)
Time-of-flight secondary ion mass spectrometer (TOF-SIMS)

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