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TOSHIBA NANOANALYSIS CORPORATION

Services

Organic Component Analysis

We support the development of diverse organic materials for electronics, functional materials, nanomaterials etc., with proper pretreatment, separation technique and analysis technology.

Our service offerings

  • Structural analysis of organic compounds
  • Qualitative and quantitative analysis of trace organic components
  • Evaluation of thermophysical properties of organic material
  • Evolved gas and Thermal desorption analysis

Examples

    Structural analysis of organic component

  • Structural analysis of polyimide film
  • Structural analysis of alignment film(NMR・FT-IR・LC/MS・GC/MS)
  • Composition analysis of ink material
  • Functional group evaluation of nano material
  • Damage analysis of electrolyte in secondary battery
  • Qualitative analysis of a rechargeable battery separator (TG/DTA・FT-IR)
  • 2D solid-state NMR by 1H detection with high-speed MAS
  • Analysis of discoloration of resin
  • Analysis of quantum dot materials
  • qualitative and quantitative analysis of very small and minor organic component

  • Depth profile analysis of organic thin film
  • Analysis of the contamination on photo mask
  • Analysis of components in micro particles
  • Analysis of floating micro particles in liquid crystal panel(Raman・FT-IR・TOF-SIMS)
  • Minute organic matter foreign substance analysis in an ink-jet nozzle( Raman・FT-IR)
  • Analysis of specific components for micron area using imaging FT-IR
  • Analysis of foreign particles
  • Chemical analysis for nanomaterials
  • High sensitivity analysis of impurities in high-purity gas using FT-IR
  • Qualitative and quantitative analysis for additives contained in polymer materials
  • Qualitative and quantitative analysis of impurities in fullerene derivatives
  • Trace component analysis in the deteriorated electrolyte
  • Thermal physical properties evaluation of organic material

  • Evaluation of cure degree and curing behavior of resin
  • Evaluation of glass transition temperature of resin
  • Analysis of generating gas and thermal desorption gas evaluation

  • Evolvedgas and desorption gas from organic films
  • Analysis of bubble components in glass
  • Source analysis of sulfur based gas causing corrosion of electronic parts
  • Evolved gas analysis
  • Prediction of lifetime of products caused by corrosive gasses
  • Other relation service

  • Analysis approach to the cause of exfoliation
  • Analysis approach for coloration and stain
  • Distribution of a tablet constituent
  • Componential analysis of a rubber material

Major equipment

  • Liquid Chromatograph/Time of Flight Mass Spectrometer(LC/TOF-MS)
  • Liquid Chromatograph/Mass Spectrometer(LC/MS)
  • Gas Chromatograph/Mass Spectrometer(GC/MS)
  • Time of Flight-Secondary Ion Mass Spectrometer(TOF/SIMS)
  • Temperature Programmed Desorption/Mass Spectrometer (TPD/MS,TG-DTA/MS)
  • Fourier Transform-Infratred Spectrometer(FT-IR)
  • Raman Spectrometer(Raman)
  • Thermogravimeter-Differential Thermal Analyzer(TG-DTA,DSC,TMA)
  • Ion Chromatogaph(IC)
  • High-Performance Liquid Chromatograph(HPLC)
  • Size Exclusion Chromatograph(SEC)

Liquid chromatograph/quadrupole time-of-flight mass spectrometer (LC/TOF-MS)
Additive agents in plastic material

Infrared microspectroscopic imaging of floating microparticles
Distribution of compound in a coating layer of pill by TOF-SIMS

Raman spectroscopic analyzer
Raman spectroscopic analyzer

Time-of-flight secondary ion mass spectrometer (TOF-SIMS)
Infrared imaging of a silicon wafer top fingerprint

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